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Defects and Diffusion in Ceramics XI - Product Image

Defects and Diffusion in Ceramics XI

  • ID: 1226358
  • May 2010
  • 356 Pages
  • Trans Tech Publications Inc

Series: Defect and Diffusion Forum, Volumes 295 - 296

An Annual Retrospective XI

This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volumes 280-281). As well as the 589 ceramics abstracts, the issue includes original papers on all of the major material groups, and theory: “Positron Annihilation in Ion-Implanted ZnO” (A.D.Acharya, G.Singh and S.B.Shrivastava), “Optical Characteristics of Tungsten Oxide Thin Films Prepared by Sputtering Technique” (S.A.Aly), “Research on Magnetization Mechanism of Nano-Magnetic Fluid” (J.Li and D.Li), “Clustering of Arsenic Atoms in Silicon during Low-Temperature Annealing” (O.Velichko and O.Burunova), “Effect of Current Density on Composition and Microstructure of Si Diffusion Layer by Electrodeposition” (H.Yang, Y.Zhang, Y.Li, G.Tang and K.Jia), “Positron Annihilation & Micro-Hardness Measurement of 6063 and 6066 with Compromise with Ingot Al” (M.A.Abdel-Rahman, A.Al-deen and E.A.Badawi), “Stress-Induced Migration and Trapping of Hydrogen in AISI403 Steel” (G.P.Tiwari, V.D.Alur and E.Ramadasan), “Electromigration Force on a Proton with a Bound State” (A.Lodder).

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Table of Contents (8 papers, 10 per page listed)

Positron Annihilation in Ion-Implanted ZnO
Aman Deep Acharya, Girjesh Singh, S.B. Shrivastava p1

Optical Characteristics of Tungsten Oxide Thin Films Prepared by Sputtering Technique
S.A. Aly p11

Research on Magnetization Mechanism of Nano-Magnetic Fluid
Jian Ling Li, Decai Li p19

Clustering of Arsenic Atoms in Silicon during Low-Temperature Annealing
Oleg Velichko, Olga Burunova p27

Effect of Current Density on Composition and Microstructure of Si Diffusion Layer by Electrodeposition
Hai Li Yang, Yu Zhu Zhang, Yun Gang Li, Guo Zhang Tang, Kuo Jia p33

Positron Annihilation & Micro-Hardness Measurement of 6063 and 6066 with Compromise with Ingot Al
M.A. Abdel-Rahman, Alaa Al-deen, Emad A. Badawi p39

Stress-Induced Migration and Trapping of Hydrogen in AISI403 Steel
G.P. Tiwari, V.D. Alur, E. Ramadasan p49

Electromigration Force on a Proton with a Bound State
A. Lodder p69

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David J. Fisher

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Note: Product cover images may vary from those shown

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