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Precision Instrumentation and Measurement

Trans Tech Publications Inc., Dec 2010, Pages: 542


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Series: Applied Mechanics and Materials, Volume 36

Selected, peer reviewed papers from the International Conference on Precision Instrumentation and Measurement 2010 (CPIM2010) and its satellite event, the International Symposium on Mass Measurement Device (MMD2010), held in our beautiful and historical city of Kiryu, March 17-20

The aim of this unique collection of peer-reviewed papers is to deepen the mutual understanding of researchers in precision measurement and related fields and to to initiate joint international research among participants.

The topics covered include precision mechanical/electrical measurements, optical measurements, metrology (mechanical, electrical), nano/micro-scale measurements, signal-processing, numerical simulation, precision control, information technology for precision measurement, dynamic calibration for force transducers and the Levitation Mass Method (LMM). The 70 papers are grouped into the chapters: I. Precision Measurement, II. Mechatronics, III: Damped Vibration and Sound, IV. Optical Measurement, V. Electrical Measurement, VI. Measurement in Social Life, VIII. Signal and Image Processing.
The contents will be of interest to metrologists and engineers working in many different fields.


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