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VLSI Test Principles and Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Most up-to-date coverage of design for testability.
Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Lecture slides and exercise solutions for all chapters are now available.
Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Chapter 1
Chapter 2
Design for Testability
Chapter 3
Logic and Fault Simulation
Chapter 4
Test Generation
Chapter 5
Logic Built-In Self-Test
Chapter 6
Test Compression
Chapter 7
Logic Diagnosis
Chapter 8
Memory Testing and Built-In Self-Test
Chapter 9
Memory Diagnosis and Built-In Self-Repair
Chapter 10
Boundary Scan and Core-Based Testing
Chapter 11
Analog and Mixed-Signal Testing
Chapter 12
Test Technology Trends in the Nanometer Age
Wang, Laung-Terng
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).
Wu, Cheng-Wen
Wen, Xiaoqing
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