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Experimental Electron Density–dilute magnetic semiconducting materials. Edition No. 1

VDM Publishing House, August 2010, Pages: 160

There are many techniques that can help evolving the minute details in the spintronics materials, but X- ray diffraction technique can give fine details of these materials in the form of charge density picture and local structure. Charge density results can be analyzed qualitatively and quantitatively for the type of bonding and also for the magnetic behavior involved. Hence, a study on these materials using experimental X-ray diffraction information is inevitable for the better understanding of local structure and magnetism. This monograph deals with the technologically important diluted magnetic semiconductors (DMS), zinc oxide based diluted magnetic semiconductors and manganites (LSMO) for their local and average structures, charge density etc.

Ramachandran, Saravanan.
Dr R. Saravanan, has been associated with the Department of Physics, The Madura College, Madurai - 625 011, India, affiliated to the Madurai Kamaraj University, Madurai, Tamil Nadu, India from the year 2000. He is involved in the investigation of novel materials using many techniques. His website is http://www.saraxraygroup.net/.