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Fault Tolerant Flip-Flop Design for Ultra-Low Power Subthreshold Logic. Edition No. 1

VDM Publishing House, Oct 2008, Pages: 116


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Low power consumption and radiation hardness are
generally competing requirements for space
electronics as well as many earth-bound high
reliability applications. Recently, subthreshold
logic has emerged as a technology that can deliver
the theoretical minimum energy per computation by
running at ultra-low levels. The resulting
performance degradation is tolerable due the dramatic
increase in energy efficiency. However, operating
circuits at such low voltages decreases the critical
charge – Qcrit - required to corrupt the contents of
memories and sequential elements. The marriage of
subthreshold logic and high-reliability electronics
is inevitable, yet there has been to date no
investigation of the effects of radiation on circuits
that operate at such low voltages. This book
provides a comprehensive comparison of a variety of
traditional flip-flop designs at subthreshold levels
- not just in terms of performance, power and area
but radiation hardness as well. Furthermore, a novel
flip-flop design is presented, which is optimized for
robust subthreshold operation.



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