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Integration and Test Plans for Complex Systems. Edition No. 1
VDM Publishing House, Oct 2008, Pages: 196
The integration and test phases that are part of the
development and manufacturing of complex
manufacturing systems are costly and time consuming.
As time-to-market is becoming increasingly important,
it is crucial to keep these phases as short as
possible, while maintaining system quality. This is
especially true for the time-to-market driven
semiconductor industry and for companies providing
manufacturing systems to this industry such as ASML,
a provider of lithographic systems. This book
describes three methods that can be used to reduce
cost and time during these integration and test
phases. These methods are: 1) a method to construct
an optimal test plan with respect to time, cost
and/or quality, 2) a method to construct an optimal
integration plan with respect to time, cost and/or
quality, and 3) a method to construct an optimal
integration and test plan with respect to time, cost
and/or quality. Furthermore, this book shows that
optimal integration and test plans are often more
efficient than manually created plans, which reduces
the time-to-market of a complex system while
maintaining the same final system quality.
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