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Advanced Measurement and Test

Trans Tech Publications Inc, Oct 2011, Pages: 2,898


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Series: Advanced Materials Research, Volumes 301 - 303

Selected, peer reviewed paper from 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011) on June 24-26, 2011, Nanchang, China

This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.


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