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Global Thin Film Metrology Systems Market 2014-2018 - Product Image

Global Thin Film Metrology Systems Market 2014-2018

  • ID: 2757633
  • January 2014
  • Region: Global
  • 50 pages
  • TechNavio

FEATURED COMPANIES

  • KLA-Tencor Corp.
  • Nanometrics Inc.
  • MORE

The analysts forecast the Global Thin Film Metrology Systems market to grow at a CAGR of 5.02 percent over the period 2013-2018. One of the key factors contributing to this market growth is the high demand for thin film metrology systems for the development of flat panel displays. The Global Thin Film Metrology Systems market has also been witnessing the increased R&D spending by vendors. However, the cyclical nature of the semiconductor industry could pose a challenge to the growth of this market.

The report, the Global Thin Film Metrology Systems Market 2014-2018, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the Americas, EMEA, and APAC; it also covers the Global Thin Film Metrology Systems market landscape and its growth prospects in the coming years. The report also includes a discussion of the key vendors operating in this market.

Key vendors dominating this space include Nanometrics Inc., Nova Measuring Instruments, KLA-Tencor Corp., and Rudolph Technologies Inc.

Other vendors mentioned in the report are Dainippon Screen Mfg Co. Ltd., FIE Co., HORIBA Ltd., Jordan Valley Semiconductors Ltd., READ MORE >

Note: Product cover images may vary from those shown

FEATURED COMPANIES

  • KLA-Tencor Corp.
  • Nanometrics Inc.
  • MORE

01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
03.1 Market Overview
03.2 Product Offerings
04. Market Research Methodology
04.1 Market Research Process
04.2 Research Methodology
05. Introduction
06. Market Landscape
06.1 Market Size and Forecast
06.2 Five Forces Analysis
07. Geographical Segmentation
07.1 Global Thin Film Metrology Systems Market by Geographical Segmentation 2013
07.2 Thin Film Metrology Systems Market in the APAC Region
07.2.1 Market Size and Forecast
07.3 Thin Film Metrology Systems Market in the Americas
07.3.1 Market Size and Forecast
07.4 Thin Film Metrology Systems Market in the EMEA Region
07.4.1 Market Size and Forecast
08. Key Leading Countries
08.1 South Korea
08.2 US
08.3 Taiwan
09. Buying Criteria
10. Market Growth Drivers
11. Drivers and their Impact
12. Market Challenges
13. Impact of Drivers and Challenges
14. Market Trends
15. Trends and their Impact
16. Vendor Landscape
16.1 Competitive Scenario
16.2 Other Prominent Vendors
17. Key Vendor Analysis
17.1 Nanometrics Inc.
17.1.1 Business Overview
17.1.2 SWOT Analysis
17.2 Nova Measuring Instruments
17.2.1 Business Overview
17.2.2 SWOT Analysis
17.3 KLA-Tencor Corp.
17.3.1 Business Overview
17.3.2 Business Segmentation of KLA-Tencor Corp. 2013
17.3.3 SWOT Analysis
17.4 Rudolph Technologies Inc.
17.4.1 Business Overview
17.4.2 Business Segmentation of Rudolph Technologies Inc. 2013
17.4.3 SWOT Analysis
18. Other Reports in this Series

List of Exhibits
Exhibit 1: Market Research Methodology
Exhibit 2: Global Thin Film Metrology Systems Market 2013-2018 (US$ million)
Exhibit 3: Global Thin Film Metrology Systems Market by Geographical Segmentation 2013
Exhibit 4: Thin Film Metrology Systems Market in the APAC Region 2013-2018 (US$ million)
Exhibit 5: Thin Film Metrology Systems Market in the Americas 2013-2018 (US$ million)
Exhibit 6: Thin Film Metrology Systems Market in the EMEA Region 2013-2018 (US$ million)
Exhibit 7: Thin Film Metrology Systems Market in South Korea 2013-2018 (US$ million)
Exhibit 8: Thin Film Metrology Systems Market in the US 2013-2018 (US$ million)
Exhibit 9: Taiwan Thin Film Metrology Systems Market 2013-2018 (US$ million)
Exhibit 10: Business Segmentation of KLA-Tencor Corp. 2013
Exhibit 11: Business Segmentation of KLA-Tencor Corp. FY2013
Exhibit 12: Business Segmentation of Rudolph Technologies Inc. 2013
Exhibit 13: Business Segmentation of Rudolph Technologies Inc. by Revenue 2013

Note: Product cover images may vary from those shown

FEATURED COMPANIES

  • KLA-Tencor Corp.
  • Nanometrics Inc.
  • MORE

Commenting on the report, an analyst from the team said: “One of the major trends emerging in the Global Thin Film Metrology Systems market is the increased R&D spending by the market vendors. Vendors such as Rudolph, KLA-Tencor, Nanometrics, and Nova Measuring Instruments have already invested a considerable amount of time and money in their R&D departments for the expansion of their product portfolios. They are also increasingly investing in their R&D divisions to provide enhanced functionality and to meet the unsatisfied requirements of end-consumers. The R&D investments have enabled them to capture a significant market share and gain a competitive edge over the other vendors in the market.”

According to the report, the high demand for thin film metrology systems for the development of flat panel displays is an important driver. These systems are used for measuring the thin films used in the flat panel displays of portable mobile devices such as smartphones, tablets, and e-readers.

Further, the report states that one of the key challenges in this market is the cyclical nature of the Semiconductor industry. The Semiconductor industry is one of the major end-users of thin film metrology systems, and any fluctuations in this industry inevitably leads to fluctuations in the Global Thin Film Metrology Systems market.

The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.

Note: Product cover images may vary from those shown

- Nanometrics Inc.
- Nova Measuring Instruments
- KLA-Tencor Corp.
- and Rudolph Technologies Inc.

Note: Product cover images may vary from those shown
Note: Product cover images may vary from those shown

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