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Global Thin Film Metrology Systems Market 2015-2019 - Product Image

Global Thin Film Metrology Systems Market 2015-2019

  • ID: 2757633
  • January 2015
  • Region: Global
  • 63 pages
  • TechNavio

FEATURED COMPANIES

  • Hitachi High-Technologies
  • KLA-Tencor
  • Nanometrics
  • Rudolph Technologies
  • SCREEN Holdings
  • Semilab
  • MORE

About Thin-film Metrology Systems
Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

The analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

Covered in this Report
This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

- ODMs
- OEMs
- Foundries

Key Regions
- Americas
- APAC
- EMEA

Key READ MORE >

Note: Product cover images may vary from those shown

FEATURED COMPANIES

  • Hitachi High-Technologies
  • KLA-Tencor
  • Nanometrics
  • Rudolph Technologies
  • SCREEN Holdings
  • Semilab
  • MORE

01. Executive Summary
02. List of Abbreviations
03. Scope of the Report
03.1 Market Overview
03.2 Product Offerings
04. Market Research Methodology
04.1 Market Research Process
04.2 Research Methodology
05. Introduction
06. Market Landscape
06.1 Market Size and Forecast
06.2 Five Forces Analysis
07. Geographical Segmentation
07.1 Global Thin Film Metrology Systems Market by Geography
08. Buying Criteria
09. Market Growth Drivers
10. Drivers and their Impact
11. Market Challenges
12. Impact of Drivers and Challenges
13. Market Trends
14. Trends and their Impact
15. Vendor Landscape
15.1 Competitive Scenario
15.2 Market Share Analysis 2013
15.3 Other Prominent Vendors
15.3.1 SCREEN Holdings
15.3.2 Semilab
15.3.3 Hitachi High-Technologies
16. Key Vendor Analysis
16.1 KLA-Tencor
16.1.1 Key Facts
16.1.2 Business Overview
16.1.3 Product Segmentation
16.1.4 Services Offered
16.1.5 Geographical Segmentation by Revenue 2014
16.1.6 SWOT Analysis
16.2 Nanometrics
16.2.1 Key Facts
16.2.2 Business Overview
16.2.3 Business Segmentation by Revenue 2013
16.2.4 Business Segmentation by Revenue 2012 and 2013
16.2.5 Geographical Segmentation by Revenue 2013
16.2.6 Business Strategy
16.2.7 Recent Developments
16.2.8 SWOT Analysis
16.3 Nova Measuring Instruments
16.3.1 Key Facts
16.3.2 Business Overview
16.3.3 Product Segmentation
16.3.4 Geographical Segmentation by Revenue 2013
16.3.5 Business Strategy
16.3.6 Key Developments
16.3.7 SWOT Analysis
16.4 Rudolph Technologies
16.4.1 Key Facts
16.4.2 Business Overview
16.4.3 Business Segmentation by Revenue 2013
16.4.4 Business Segmentation by Revenue 2012 and 2013
16.4.5 Geographical Segmentation by Revenue 2013
16.4.6 Business Strategy
16.4.7 Recent Developments
16.4.8 SWOT Analysis
17. Other Reports in this Series

List of Exhibits
Exhibit 1: Market Research Methodology
Exhibit 2: Semiconductor Value Chain
Exhibit 3: Global Thin Film Metrology Systems Market (US$ million)
Exhibit 4: Global Thin Film Metrology Systems Market by Geography 2014-2019 (CAGR)
Exhibit 5: Global Thin Film Metrology Systems Market by Geography 2014-2019
Exhibit 6: Global Thin Film Metrology Systems Market by Geography 2014-2019 (US$ million)
Exhibit 7: Global Thin Film Metrology Systems Market by Vendor Segmentation 2014
Exhibit 8: KLA-Tencor: Product Segmentation
Exhibit 9: KLA-Tencor: Services Offered
Exhibit 10: KLA-Tencor: Geographical Segmentation by Revenue 2014
Exhibit 11: Nanometrics: Business Segmentation by Revenue 2013
Exhibit 12: Nanometrics: Business Segmentation by Revenue 2012 and 2013 (US$ billion)
Exhibit 13: Nanometrics: Geographical Segmentation by Revenue 2013
Exhibit 14: Nova Measuring Instruments: Product Segmentation 2013
Exhibit 15: Nova Measuring Instruments: Geographical Segmentation by Revenue 2013
Exhibit 16: Rudolph Technologies: Business Segmentation by Revenue 2013
Exhibit 17: Rudolph Technologies: Business Segmentation by Revenue 2012 and 2013(US$ million)
Exhibit 18: Rudolph Technologies: Geographical Segmentation by Revenue 2013

Note: Product cover images may vary from those shown

FEATURED COMPANIES

  • Hitachi High-Technologies
  • KLA-Tencor
  • Nanometrics
  • Rudolph Technologies
  • SCREEN Holdings
  • Semilab
  • MORE

Commenting on the report, an analyst from the team said: “One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process.”

According to the report, one of the main drivers of the market is the increased level of complexity in ICs. Over the years, the number of functions an IC has been able to do has increased considerably, resulting in the introduction of complex architectures such as 3D and FinFET. This is expected to foster the demand for thin film metrology systems as they are used in the manufacturing of complex semiconductor ICs.

Further, the report states that the cyclical nature of the semiconductor industry is one of the main challenges in the market. The revenue generated in the Semiconductor industry is cyclical in nature which acts as a major challenge for thin film metrology systems as they are dependent on the economic condition and the capital expenditure cycle of semiconductor manufacturers. Often production tends to exceed the demand during economic downturn, resulting in inventory pileup and, thus, low demand for semiconductor devices.

The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.

Note: Product cover images may vary from those shown

- KLA-Tencor
- Nanometrics
- Nova Measuring Instruments
- Rudolph Technologies
- Hitachi High-Technologies
- SCREEN Holdings
- Semilab

Note: Product cover images may vary from those shown
Note: Product cover images may vary from those shown

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Ametek, Inc. Intel Corporation Micronas Group Analog Devices, Inc. Applied Materials, Inc. Fairchild Semiconductor, Inc.