Advances in Imaging and Electron Physics, Vol 109

  • ID: 1753658
  • Book
  • 453 Pages
  • Elsevier Science and Technology
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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Forthcoming Contributions

Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques

Complex Dyadic Multiresolution Analyses

Lattice Vector Quantization for Wavelet-Based Image Coding

Fuzzy Cellular Neural Networks and Their Applications to Image Processing

Index

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Kazan, Benjamin.
Mulvey, Tom.
Hawkes, Peter W.

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