Advances in Imaging and Electron Physics, Vol 160

  • ID: 1753681
  • Book
  • 320 Pages
  • Elsevier Science and Technology
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

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1. Gamut Mapping
Zofia Baranczuk, Joachim Giesen, Klaus Simon, Peter Zolliker 2. Color Area Morphology Scale-Spaces
Adrian N.Evans 3. Harmonic Holography
Ye Pu, Chia-Lung Hsieh, Rachel Grange, Demetri Psaltis 4.Lattice Algebra Approach to Endmember Determination in Hyperspectral Imagery
Gerhard X. Ritter, Gonzalo Urcid 5. Origin And Background Of The Invention Of The Electron Microscope
Reinhold Rudenberg 6. Origin and Background of the Invention of the Electron Microscope: Commentary and Expanded Notes on Memoir of Reinhold Rudenberg
H. Gunther Rudenberg, Paul G. Rudenberg

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Hawkes, Peter W.

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