Advances in Imaging and Electron Physics, Vol 165 - Product Image

Advances in Imaging and Electron Physics, Vol 165

  • ID: 1753691
  • Book
  • 360 Pages
  • Elsevier Science and Technology
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
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  1. 2D Fourier Transforms in Polar Coordinates Natalie Baddour
  2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagation Neil V. Budko
  3. Chromatic aberration correction
    the next step in electron microscopy Rowan Leary and Rik Brydson
  4. Methods for vectorial analysis and imaging in high-resolution laser microscopy Michele Marrocco
  5. Image Hierarchy in Gaussian Scale Space Tomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya
  6. The Theory of the Boundary Diffraction Wave Yusuf Ziya Umul
  7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Diffraction Measurements Emil Wolf
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Hawkes, Peter W.

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