Advances in Imaging and Electron Physics, Vol 167

  • ID: 1753692
  • Book
  • 360 Pages
  • Elsevier Science and Technology
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

- Contributions from leading international scholars and industry experts- Discusses hot topic areas and presents current and future research trends- Invaluable reference and guide for physicists, engineers and mathematicians

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- A History Of Cameca

Emmanuel de Chambost

- Theory and Applications of General Adaptive Neighborhood Image Processing

Johan Debayle, Jean-Charles Pinoli

- Shape Recognition Based on Eigenvalues of the Laplacian

M. Ben Haj Rhouma, M.A. Khabou, L. Hermi

- Point Set Analysis

Nicolas Lomenie, Georges Stamon

- Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals

Leonid P. Yaroslavsky
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Hawkes, Peter W.

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