+353-1-416-8900REST OF WORLD
+44-20-3973-8888REST OF WORLD
1-917-300-0470EAST COAST U.S
1-800-526-8630U.S. (TOLL FREE)

PRINTER FRIENDLY

Characterization of Semiconductor Materials, Volume 1. Principles and Methods- Product Image
Characterization of Semiconductor Materials, Volume 1. Principles and Methods- Product Image

Characterization of Semiconductor Materials, Volume 1. Principles and Methods

  • ID: 1758094
  • Book
  • December 1989
  • Elsevier Science and Technology
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
Note: Product cover images may vary from those shown
Electrical Characterization of Semiconductor Materials and Devices
Secondary Ion Mass Spectrometry
Photoelectron Spectroscopy: Applications to Semiconductors
Ion/Solid Interaction in Surface Analysis
Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy
Characterization of Semiconductors Surfaces by Appearance Potential Spectroscopy
References
Index
Note: Product cover images may vary from those shown
Gary F. McGuire MCNC, Electronic Technologies Division, Research Triangle Park, NC.
Note: Product cover images may vary from those shown
Adroll
adroll