Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
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Secondary Ion Mass Spectrometry
Photoelectron Spectroscopy: Applications to Semiconductors
Ion/Solid Interaction in Surface Analysis
Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy
Characterization of Semiconductors Surfaces by Appearance Potential Spectroscopy