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Statistics in Spectroscopy. Edition No. 2

  • ID: 1763708
  • Book
  • 342 Pages
  • Elsevier Science and Technology
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Statistics in Spectroscopy, Second Edition, is an expanded and updated version of the original title. The aim of the book is to bridge the gap between the average chemist/spectroscopist and the study of statistics. The book introduces the novice reader to the ideas and concepts of statistics and uses spectroscopic examples to show how these concepts are applied. Several key statistical concepts are introduced through the use of computer programs.

Serves as a primer for all chemists who

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1. Introduction: Why this Book?
2. Important Concepts from Probability Theory
3. Populations and Samples: The Meaning of "Statistics"
4. Degrees of Freedom
5. Introduction to Distributors and Probability Sampling
6. The Normal Distribution
7. Alternative Ways to Calculate Standard Deviation
8. The Central Limit Theorem
9. Synthesis of Variance
10. Where are we and Where are we Going?
11. More and Different Statistics
12. The T Statistic
13. Distribution of Means
14. One-and Two-Tailed Tests
15. Philosophical Interlude
16. Biased and Unbiased Estimators
17. The Variance of Variance
18. Hypothesis Testing of Chi-Square
19. More Hypothesis Testing
20. Statistical Inferences
21. How to Count
22. And Still Counting
23. Contingency Tables
24. What do you Mean: Random?
25. The F Statistics
26. Precision and Accuracy: Introduction to Analysis of Variance
27. Analysis of Variance and Statistical Design of Experiments
28. Crossed and Nested Experiments
29. Miscellaneous Considerations Regarding Analysis of Variance
30. Pitfalls of Statistic
31. Pitfalls of Statistic Continued
32. Calibration in Spectroscopy
33. Calibration: Linear Regression as a Statistical Technique
34. Calibration: Error Sources in Calibration
35. Calibration: Selecting the Calibration Samples
36. Calibration: Developing the Calibration Model
37. Calibration: Auxiliary Statistics for the Calibration Model
38. The Beginning
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Mark, Howard
Howard Mark is President of Mark Electronics, Suffern, New York. He was previously affiliated as a Senior Scientist at Technicon Instrument Corp. in Tarrytown, New York. He holds a B.S. degree from City College of New York, an M.A. from City University of New York, and a PhD from New York University. His professional interests include instrument development, especially for spectroscopy; statistical and chemometric data analysis; and Custom software development, especially for implementation of data analysis algorithms. He received the 2003 Eastern Analytical Symposium Award for Achievement in Near Infrared Spectroscopy. He holds 6 U.S patents and has published 2 books and numerous book chapters. He has acted as Associate editor for the Handbook of Vibrational Spectroscopy, Wiley (2001). He has served as Past president of Council for Near-Infrared Spectroscopy (CNIRS), Treasurer of the New York section of the Society for Applied Spectroscopy, and as Past Chair of the New York section of the Society for Applied Spectroscopy. In addition he acts as Contributing editor and member of the Editorial Advisory Board of Spectroscopy. He has published over 150 peer-reviewed papers dealing with design and development of scientific instrumentation, new concepts in computerized instrumentation and data analysis.
Workman, Jr., Jerry
Jerry Workman, Jr. is Chief Technical Officer and Vice President of Research

& Engineering at Argose Inc., Waltham, MA. In his career, Workman has

focused on molecular and electronic spectroscopy and chemometrics. He has

published over 200 scientific papers, 7 text volumes, and over 20 patents,

patents pending, and trade secrets. He received the B. A. degree in natural

sciences and M. A. degree in biological sciences and genetics from Saint

Mary's University of Minnesota, and the Ph.D. degree in biological chemistry

from Columbia Pacific University. He has completed technical management

certificates from Columbia University and MIT. He is a Fellow of the

American Institute of Chemists, the American Society for Testing and

Materials International, and the Royal Society of Chemistry. In 2002 he was

the recipient of the ASTM International Award of Merit; IBC International

Scientist of the Year; and the Eastern Analytical Symposium Award for

Outstanding Achievements in the Field of Near Infrared Spectroscopy.

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