Advances in Imaging and Electron Physics, Vol 168

  • ID: 1772298
  • Book
  • 392 Pages
  • Elsevier Science and Technology
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

- Contributions from leading international scholars and industry experts- Discusses hot topic areas and presents current and future research trends- Invaluable reference and guide for physicists, engineers and mathematicians

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  1. The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach

    LucaGeretti, AntonioAbramo

  2. Logarithmic Image Processing for Color Images

    M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs

  3. Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography

    Rainer A. Leitgeb

  4. Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object's surface in mirror electron microscopy

    S.A. Nepijko, G. Schönhense

  5. Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging

    Chad M. Parish

  6. Aberration Correctors developed under Triple C Project

    Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga

  7. Spatially resolved thermoluminescence in a scanning electron microscope

T. Schulz, M. Albrecht, K.Irmscher

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Hawkes, Peter W.

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