Materials Reliability in Microelectronics III: Volume 309. MRS Proceedings

  • ID: 2129162
  • Book
  • Cambridge University Press
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Kenneth P. Rodbell IBM T J Watson Research Center, New York.

William F. Filter
Harold J. Frost Dartmouth College, New Hampshire.

Paul S. Ho University of Texas, Austin.
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