Materials Reliability in Microelectronics IV: Volume 338. MRS Proceedings

  • ID: 2129186
  • Book
  • Cambridge University Press
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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Peter Børgesen
John C. Coburn
William F. Filter
John E. Sanchez, Jr.
Kenneth P. Rodbell
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