There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
Note: Product cover images may vary from those shown