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Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466. MRS Proceedings

  • ID: 2129289
  • Book
  • September 1997
  • 282 Pages
  • Cambridge University Press
There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
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David J. Smith Arizona State University.
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