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Basic ESD and I/O Design

  • ID: 2172613
  • Book
  • 328 Pages
  • John Wiley and Sons Ltd
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The first comprehensive guide to ESD protection and I/O design

Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high–speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much–needed reference for practicing engineers who are frequently called upon to learn the subject on the job.

This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design:

  • Describes strategies for design–oriented ESD protection
  • Explains layout methods that enhance ESD protection designs
  • Addresses basic I/O designs, including new problems such as mixed voltage interfaces
  • Discusses fabrication aspects affecting ESD and I/O protection
  • Illustrates concepts using numerous figures and examples
  • Expresses device physics in terms of simple electrical circuit models
  • Cross–references the material to standard texts in the field

Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture.

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ESD Protection Methodology.

Additional ESD Considerations.


Layout Issues.

ESD and I/O Interactions.

Mixed–Voltage ESD.

ESD Reliability Measurement and Failure Analysis Basics.


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Sanjay Dabral
Timothy Maloney
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