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An Introduction to Surface Analysis by XPS and AES

  • ID: 2174269
  • Book
  • 226 Pages
  • John Wiley and Sons Ltd
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An Introduction to Surface Analysis by Electron Spectroscopy is a clear and accessible introduction to the key spectroscopic techniques used in surface analysis. Focusing on the two most popular surface science techniques; X–ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), the book will be of benefit to both students and users in industry who require a rapid grounding in the methods before carrying out their own analysis.

Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complimentary methods have been included to provide an up–to–date account of these widely used techniques.

  • Examples taken from the fields of metallurgy, corrosion, microelectronics, polymers and adhesion.
  • Detailed glossary of key surface analysis terms.
  • An invaluable text for undergraduate and postgraduate students studying surface analysis within science and engineering.
  • A useful reference to those working within the field and needing to familiarize themselves with these important techniques.
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Electron Spectroscopy: Some Basic Concepts.

Electron Spectrometer Design.

The Electron Spectrum: Qualitative and Quantitative Interpretation.

Compositional Depth Profiling.

Applications of Electron Spectroscopy in Materials Science.

Comparison of XPS and AES with Other Analytical Techniques.


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John F. Watts
John Wolstenholme
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