Systematic errors from poor sampling and improper specimen preparation can easily render X–ray diffraction (XRD) and X–ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.
This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X–ray analysis – complete with theory, step–by–step methods, equipment suggestions, and problem–solving tips.
With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results–saving valuable time, money, and effort.
Covers X–ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
∗ Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
∗ Features special chapters on specimen preparation equipment and XRF standards
∗ Contains useful bibliography and helpful references.
Specimen Preparation in X–Ray Fluorescence.
Specimen Preparation in X–Ray Diffraction.
Specific Areas of Specimen Preparation in X–Ray Powder Diffraction.
Special Problems in the Preparation of X–Ray Diffraction Specimens.
Specimen Preparation for Camera Methods.
Specimen Preparation Equipment.
Use of Standards in X–Ray Fluorescence Analysis.
RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.
DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.