Exploring Scanning Probe Microscopy with MATHEMATICA. 2nd, Revised and Enlarged Edition

  • ID: 2180222
  • Book
  • 310 Pages
  • John Wiley and Sons Ltd
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This new and completely updated edition features not only an accompanying CD–ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with atomic force microscopy, scanning tunneling microscopy, and related technologies. The result is both a solid professional reference and an advanced–level text, beginning with the basics and moving on to the latest techniques, experiments, and theory.

The self–contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The MATHEMATICA code for

all the text, figures and tables is included in the CD–ROM, affording the freedom to change the parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

Changing the parameters and running the code will have the effect of automatically replacing the relevant figures and tables presented in the book.
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1 Introduction

2 Uniform Cantilevers

3 Cantilever Conversion Tables

4 V–Shaped Cantilevers

5 Tip Sample Adhesion

6 Tip Sample Force Curve

7 Free Vibrations

8 Noncontact Mode

9 Tapping Mode

10 Metal–Insulator–Metal Tunneling

11 Fowler–Nordheim Tunneling

12 Scanning Tunneling Spectroscopy

13 Coulomb Blockade

14 Density of States

15 Electrostatics

16 Near–Field Optics

17 Constriction and Boundary Resistence

18 Scanning Thermal Conductivity Microscopy

19 Kelvin Probe Force Microscopy

20 Raman Scattering in Nanocrystals
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Dror Sarid
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