In today s growing high–technology environment, engineering product designers are regularly faced with the problem of electromagnetic interference that can affect optimal product performance and prevent compliance with today s stringent regulatory EMC standards. Testing for EMC Compliance: Approaches and Techniques offers a simple and efficient troubleshooting guide designed to demystify what can often be a time–consuming and costly debugging process.
Mark Montrose and Edward Nakauchi offer easy and inexpensive methods to resolve EMC problems and help generate ideas for developing diagnostic tools and measurement procedures required to resolve any compliance issue. Their clear writing style makes this serious and daunting reference material uniquely accessible and enjoyable to read.
For anyone whose work must conform to regulatory standards, here s an invaluable resource that
- Requires only a basic knowledge of math, electronics, and EMC standards
- Features simple and practical methodologies anyone can easily implement
- Gives engineers the necessary tools and skills to design products quickly and efficiently
- Helps technicians avoid costly trial and error techniques
- Includes a unique appendix on how to build probes in new and interesting ways
- Includes a complete Testing Procedure Methodology appendix detailing the majority of EMC tests performed on today s products
Innovative, highly readable, and filled with tricks of the trade that can save today s high–technology product designers valuable time and money, Testing for EMC Compliance: Approaches and Techniques is an invaluable resource for anyone concerned with achieving optimum signal integrity.
2. Electric, Magnetic, and Static Fields.
4. Test Facilities.
5. Probes, Antennas, and Support Equipment.
6. Conducted Testing.
7. Radiated Testing.
8. General Approaches Troubleshooting.
9. On–Site Troubleshooting Techniques.
Appendix A: Building Probes.
Appendix B: Test Procedures.
About the Authors.
"The authors have developed a logical approach to understanding testing for EMC." (IEEE EMC Society Newsletter, Summer 2006)