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Multisensor Instrumentation 6s Design. Defined Accuracy Computer-Integrated Measurement Systems. Edition No. 1

  • ID: 2182459
  • Book
  • April 2002
  • 224 Pages
  • John Wiley and Sons Ltd
A groundbreaking book based on a landmark quality initiative

In today's information-driven enterprises, accuracy is essential in computer-integrated measurement and control systems, where academia, government, and industry invest considerable resources in methodologies for achieving and maintaining high performance. Multisensor Instrumentation 6σ Design offers a blueprint-drawn from the author's thirty years of experience at federal laboratories, steel producers, and General Electric-for defined-accuracy computer-based measurement and control instrumentation. Based on GE's Six-Sigma initiative, which was described by GE Chairman and CEO Jack Welch as "the most important initiative this company has ever undertaken," it presents a proven methodology for defining, measuring, analyzing, improving, and controlling the quality of enterprise products, processes, and transactions.

Multisensor Instrumentation 6σ Design offers readers:

  • A proven measurement and process control resource based on an important industry initiative
  • Expert pedagogy from an author with many years of practical industry involvement and electrical engineering instruction
  • A professional reference and textbook with a solutions manual
  • Accompanying user-interactive error-modeling software instrumentation design and spreadsheet

An important resource for electrical and computer engineering students and practitioners, as well as professionals in such fields as manufacturing, biotechnology, and process systems, Multisensor Instrumentation 6σ Design is universally applicable to all fields that employ real-time computer integration of processes and transactions.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Note: Product cover images may vary from those shown

1. Process, Quantum, and Analytical Sensors.

1-0 Introduction.

1-1 Instrumentation Error Representation.

1-2 Temperature Sensors.

1-3 Mechanical Sensors.

1-4 Quantum Sensors.

1-5 Analytical Sensors.


2. Instrumentation Amplifiers and Parameter Errors.

2-0 Introduction.

2-1 Device Temperature Characteristics.

2-2 Differential Amplifiers.

2-3 Operational Amplifiers.

2-4 Instrumentation Amplifiers.

2-5 Amplifier Parameter Error Evaluation.


3. Active Filter Design with Nominal Error.

3-0 Introduction.

3-1 Lowpass Instrumentation Filters.

3-2 Active Filter Networks.

3-3 Filter Error Analysis.

3-4 Bandpass Instrumentation Filters.


4. Linear Signal Conditioning to Six-Sigma Confidence.

4-0 Introduction.

4-1 Signal Conditioning Input Considerations.

4-2 Signal Quality Evaluation and Improvement.

4-3 DC, Sinusoidal, and Harmonic Signal Conditioning.

4-4 Redundant Signal Conditioning and Diagnostics.


5. Data Conversion Devices and Errors.

5-0 Introduction.

5-1 Analog Multiplexers.

5-2 Sample Holds.

5-3 Digital-to-Analog Converters.

5-4 Analog-to-Digital Converters.


6. Sampling and Reconstruction with Intersample Error.

6-0 Introduction.

6-1 Sampled Data Theory.

6-2 Aliasing of Signal and Noise.

6-3 Step-Interpolated Data Intersample Error.

6-4 Output Signal Interpolation, Oversampling, and Digital Conditioning.


7. Measurement and Control Instrumentation Error Analysis.

7-0 Introduction.

7-1 Low-Data-Rate Digital Control Instrumentation.

7-2 High-Data-Rate Video Acquisition.

7-3 Computer-Integrated Instrumentation Analysis Suite


8. Multisensor Architectures and Error Propagation.

8-0 Introduction.

8-1 Multisensor Fusion, Integration, and Error.

8-2 Sequential Multisensor Architecture.

8-3 Homogeneous Multisensor Architecture.

8-4 Heterogeneous Multisensor Architecture.


9. Instrumentation System Integration and Interfaces.

9-0 Introduction.

9-1 System Integration and Interface Buses.

9-2 Instrument Serial Bus Interfaces.

9-3 Microwave Microscopy Virtual Instrument.

9-4 Analytical Instrumentation in Advanced Control.


Note: Product cover images may vary from those shown
Patrick H. Garrett The University of Cincinnati.
Note: Product cover images may vary from those shown