Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in–depth introduction to the field of thin film X–ray characterization in a clear and precise manner.
Identification of Chemical Phases
Line Profile Analysis
Grazing Incidence Configurations
Texture and Preferred Orientation
Residual Stress Analysis
High Resolution X–ray Diffraction