Microbeam Analysis-1995

  • ID: 2245409
  • Book
  • 462 Pages
  • John Wiley and Sons Ltd
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This Proceeding of the 29th Annual meeting of the Microbeam Analysis Society contains the most current new developments in all techniques of microscopic analysis and related topics.
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PRESIDENTIAL SYMPOSIUM ON EMERGING DETECTOR TECHNOLOGY IN MICROANALYSIS

Low Temperature X–Ray Detectors with 10–20 eV Resolution and High Count Rates

Status of Compound High –Z Semiconductor Detectors for X–Ray Spectroscopy

HIGHLIGHTS IN CLASSIC LIGHT MICROSCOPY

Authentication of Art Objects: Shroud of Turin

Analysis of the Tremolite/Actinolite Series using High Precision Refractive Index Measurements

MATRIX–ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY IN MICROANALYSIS

Fundamental Studies of Matrix–Assisted Laser Desorption Ionization

The Role of Solubility in the Analysis of Synthetic Polymer Materials by Matrix–Assisted Laser Desorption/Ionization Time–of–Flight Mass Spectrometry

SECONDARY ION MASS SPECTROMETRY

Molecular Surface Analysis by TOF–SIMS

The Depth Measurement of Craters Produced by Secondary Ion Mass Spectrometry––Results of a Stylus Profilometer Round–Robin Study

SCANNING PROBE MICROSCOPY

Spectroscopy and Dynamics of Nanostructured J–Aggregates Probed by Near–Field Scanning Optical Microscopy (NSOM)

Optical and Structural Properties of Langmuir–Blodgett Films at the Air/Water Interface and the Solid/Air Interface

MICROFLUORESCENCE/LUMINESCENCE INSTRUMENTATION AND APPLICATIONS

Quantitative Fluorescence Imaging of Thin Films using Tunable Filter Technology

INFRARED AND RAMAN MICROANALYSIS

Applications of a Novel Infrared Interferometric Technique for Rapidly Performing Simultaneous Chemical State Imaging and Spectroscopy

Infrared Microspectroscopy and Computer Library Searching

SAMPLE PREPARATION FOR MICROANALYSIS

Chemical Ion Milling of Materials

MICRO–XRD/XRF CHEMICAL STATE

Fabrication and Development of Tapered Capillary X–Ray Optics for Microbeam Analysis

DETECTION AND ANALYSIS OF SOFT X–RAYS

Analysis from X–Ray Emission Bands

QUANTITATIVE X–RAY MICROANALYSIS

A New Quantitative Procedure for Stratified Samples in EPMA

MICROANALYSIS FOR NANOTECHNOLOGY

The Analysis of Nanoscale Particles by Analytical Electron Microscopy

CHEMOMETRIC TECHNIQUES FOR SPECTRAL ANALYSIS

Numerical Methods for TOF–SIMS Analysis

ANALYTICAL ELECTRON MICROSCOPY IN THE MATERIALS SCIENCES

Integrated NanoAnalytical Techniques and Tele–Presence Microscopy at the ANL Advanced Analytical Electron Microscope

Calculation of Near Edge Structure

A Study of EELS Fine Structure in Three Chromium Carbides

ANALYTICAL ELECTRON MICROSCOPY IN THE BIOLOGICAL SCIENCES

Interactive Elemental Image Acquisition and Processing

WORKSHOP ON ELECTRON BEAM/SPECIMEN INTERACTION MODELING FOR METROLOGY AND MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE, PART II

Workshop Report 1: Scanning Electron Microscope Metrology as Related to a Defined Edge Structure

COMPUTATIONAL METHODS IN MICROSCOPY

Electron Stopping Powers––A Progress Report

ADVANCES IN SCANNING ELECTRON MICROSCOPY

Low KV X–Ray Mapping in a FESEM

Contrast Mechanisms in the ESEM Analyzed and Enriched by Differential Hysteresis Image Processing

IMAGE PROCESSING AND MULTIVARIATE IMAGE ANALYSIS IN MICROSCOPY

An Overview of Multivariate Image Analysis

MICROPROBE APPLICATIONS IN MATERIALS SCIENCE

The Development of an Electronic Microscopy and Microanalysis Journal on the World Wide Web

MICROANALYTICAL APPLICATIONS IN THE GEOSCIENCES

Laser Microprobe Stable Isotopic Studies of Sulfide, Silicate and Carbonate Minerals

NEW AND EMERGING TECHNIQUES

Recent Developments in Curved Diffractors for Focussing X–Rays

Nondestructive Acoustic Inspection for Long–Term Reliability Studies of Power IC′s
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Edgar S. Etz
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