Advances in Imaging and Electron Physics, Vol 169

  • ID: 2485477
  • Book
  • 266 Pages
  • Elsevier Science and Technology
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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  1.  Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy
    A. Sever Skapin
  2. Optical interference near surfaces and its application in sub-wavelength microscopy
    W. S. Bacsa
  3. Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy
    Ruy H. A Farias and Erasmo RECAMI
  4. Superresolution Imaging
    Markus E. Testorf
  5. Methods and Limitations of Subwavelength Imaging Andrew Neice
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