Global Semiconductor Inspection Systems Market 2016-2020

  • ID: 3883909
  • Report
  • Region: Global
  • 76 pages
  • TechNavio
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FEATURED COMPANIES

  • Applied Materials
  • Carl Zeiss
  • Hermes Microvision
  • JEOL
  • Lam Research
  • Nanometrics
  • MORE
About Inspection Systems

Inspection systems are part of fabrication equipment in the semiconductor device manufacturing process. These systems are used to find defects in masks and wafers during the production process of semiconductor wafers. The growing application of semiconductor ICs in segments like automobiles, consumer electronics, and industrial sector has compelled semiconductor ICs vendors to increase their production capacities. This will create substantial demand for inspection systems in the global semiconductor market.

The analysts forecast the global semiconductor inspection system market to grow at a CAGR of 11.74% during the period 2016-2020.

Covered in this report
The report covers the present scenario and the growth prospects of the global semiconductor inspection system market for 2016-2020. To calculate the market size, the report considers the sale of semiconductor inspection systems.

The market is divided into the following segments based on geography:
- Americas
- APAC
- EMEA

The report, Global Semiconductor Inspection System Market 2016-2020, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the market landscape and its growth prospects over the coming years. The report also includes a discussion of the key vendors operating in this market.

Key vendors
- Applied Materials
- Hermes Microvision
- KLA-Tencor
- Lasertec

Other prominent vendors
- SML Holding
- Carl Zeiss
- FEI
- Hitachi High-Technologies
- JEOL
- Nanometrics
- Nikon
- Planar
- Lam Research
- Rudolph Technologies
- Tokyo Seimitsu
- Toray Engineering

Market drivers
- Increasing demand for high-precision miniaturized electronic devices
- For a full, detailed list, view the full report

Market challenges
- Growing mask complexity
- For a full, detailed list, view the full report

Market trends
- Growing proliferation of IoT and connected devices
- For a full, detailed list, view the full report

Key questions answered in this report
- What will the market size be in 2020 and what will the growth rate be?
- What are the key market trends?
- What is driving this market?
- What are the challenges to market growth?
- Who are the key vendors in this market space?
- What are the market opportunities and threats faced by the key vendors?
- What are the strengths and weaknesses of the key vendors?

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Note: Product cover images may vary from those shown
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FEATURED COMPANIES

  • Applied Materials
  • Carl Zeiss
  • Hermes Microvision
  • JEOL
  • Lam Research
  • Nanometrics
  • MORE
PART 01: Executive summary
  • Highlights
PART 02: Scope of the report
  • Definition
  • Base year and forecast period
  • Market reportage
  • Market size computation
  • Market segmentation
  • Geographical coverage
  • Vendor segmentation
  • Common currency conversion rates
  • Top-vendor offerings
PART 03: Market research methodology
  • Research methodology
  • Economic indicators
PART 04: Introduction
  • Key market highlights
PART 05: Market landscape
  • Market overview
  • Wafer inspection
  • Mask inspection
  • Market size and forecast
  • Five forces analysis
PART 06: Market segmentation by type
  • Types of inspection systems
  • Wafer inspection systems
  • Mask inspection systems
PART 07: Market segmentation by technology
  • Global semiconductor inspection system market by technology
PART 08: Market segmentation by end-user
  • Global semiconductor inspection system market by end-user
PART 09: Geographical segmentation
  • Global semiconductor inspection system market by region
  • APAC
  • Americas
  • EMEA
PART 10: Market drivers
  • Growing number of fabs
  • High requirement for SoC technology
  • Increasing demand for high-precision miniaturized electronic devices
  • Explosive growth of wireless computing devices
  • Lack of alternatives to photomask technology
  • Growing requirement of semiconductor inspection systems for R&D purposes
PART 11: Impact of drivers

PART 12: Market challenges
  • Need for high initial capital investment
  • High inventory levels in supply chain
  • Dependency on few key suppliers
  • Growing mask complexity
  • Complex semiconductor wafer designs
PART 13: Impact of drivers and challenges

PART 14: Market trends
  • Constant decline in lithography wavelength
  • Growing proliferation of IoT and connected devices
  • High need for semiconductor memory devices
  • Growing acceptance of wearable devices
  • Increase in wafer size
  • Smaller life cycle of mobile devices
  • Growth of smart cities
  • Increasing vehicle automation
  • Development of multi-beam e-beam inspection
PART 15: Vendor landscape
  • Competitive landscape
  • Key vendors
  • Other prominent vendors
PART 16: Appendix
  • List of abbreviations
PART 17: About the Author

List of Exhibits
Exhibit 01: Segmentation of global semiconductor inspection system market
Exhibit 02: Major countries covered
Exhibit 03: Market vendors
Exhibit 04: Currency conversions
Exhibit 05: Product offerings
Exhibit 06: Types of wafer inspection
Exhibit 07: Patterned and unpatterned wafers in wafer inspection market 2015 and 2020 (% share)
Exhibit 08: Strength and limitations of unpatterned wafer inspection equipment
Exhibit 09: E-beam patterned wafer inspection equipment market (% share)
Exhibit 10: Comparison between optical and e-beam wafer inspection equipment
Exhibit 11: Global semiconductor inspection system market 2015-2020 ($ billions)
Exhibit 12: Five forces analysis
Exhibit 13: Types of semiconductor inspection systems 2015 (% share)
Exhibit 14: Types of semiconductor inspection systems 2020 (% share)
Exhibit 15: Global semiconductor inspection system market by wafer inspection system ($ billions)
Exhibit 16: Global semiconductor inspection system market by mask inspection system ($ millions)
Exhibit 17: Captive and merchant mask makers in mask inspection segment 2015-2020 (% share)
Exhibit 18: Global semiconductor inspection system market by technology 2015-2020 (% share)
Exhibit 19: Global semiconductor inspection system market by end-user 2015-2020 (% share)
Exhibit 20: Global semiconductor inspection system market by region 2015 (% share)
Exhibit 21: Global semiconductor inspection system market by region 2020 (% share)
Exhibit 22: Semiconductor inspection system market in APAC 2015-2020 ($ billions)
Exhibit 23: Semiconductor inspection system market in Americas 2015-2020 ($ millions)
Exhibit 24: Semiconductor inspection system market in EMEA 2015-2020 ($ millions)
Exhibit 25: Global NAND flash market 2015-2020 (% share)
Exhibit 26: CAGR of LED chip and sensor market 2015-2020
Exhibit 27: Impact of drivers
Exhibit 28: Global semiconductor market trend 1990-2015 ($ billions)
Exhibit 29: Impact of drivers and challenges
Exhibit 30: Node transition in semiconductor industry
Exhibit 31: Requirement for IoT
Exhibit 32: CAGR of 3D NAND and DRAM 2016-2020
Exhibit 33: Timeline for semiconductor wafer size advancements
Exhibit 34: Car shipment growth forecast 2015-2020
Exhibit 35: Key vendors in global semiconductor inspection system market 2015 (% share)
Exhibit 36: Applied Materials: Segment-wise revenue contribution 2015 (% share)
Exhibit 37: Applied Materials: Segment-wise revenue break-up 2015 ($ billions)
Exhibit 38: Applied Materials: Silicon system segment performance 2014-2015 ($ billions)
Exhibit 39: Applied Materials: R&D expenses 2011-2015 ($ billions)
Exhibit 40: HMI: Product segmentation by revenue 2015 (% share)
Exhibit 41: Product launches and expected product developments
Exhibit 42: Revenue contribution of two operating segments (% share)
Exhibit 43: Comparison of company’s segments 2013-2015 ($ billions)
Exhibit 44: KLA-Tencor: Revenue of defect inspection segment 2013-2015 ($ billions)
Exhibit 45: KLA-Tencor: R&D expenses 2013-2015 ($ millions)
Exhibit 46: Lasertec Corporation: Revenue contribution from segments till June 2015 (% share)
Exhibit 47: Lasertec Corporation: Sales comparison 2014 and 2015 ($ millions)
Exhibit 48: Other prominent vendors
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FEATURED COMPANIES

  • Applied Materials
  • Carl Zeiss
  • Hermes Microvision
  • JEOL
  • Lam Research
  • Nanometrics
  • MORE
New Report Released: – Global Semiconductor Inspection System Market 2016-2020

The author of the report recognizes the following companies as the key players in the global semiconductor inspection system market: Applied Materials, Hermes Microvision, KLA-Tencor, and Lasertec.

Other Prominent Vendors in the market are: ASML Holding, Carl Zeiss, FEI, Hitachi High-Technologies, JEOL, Nanometrics, Nikon, Planar, Lam Research, Rudolph Technologies, Tokyo Seimitsu, and Toray Engineering.

Commenting on the report, an analyst from the research team said: “Smaller life cycle of mobile devices will be a key trend for market growth. Technological advances and an increase in global disposable income have brought about a change in the buying pattern of consumers. Electronic devices such as mobile and consumer devices are becoming obsolete fast (within one to one-and-half years) and are being replaced by higher versions or models with better technology launched by OEMs. This has reduced the product replacement cycle for such devices. According to industry experts, as of 2015, 70% of Apple iPhone revenue is contributed by recurring sales, while the remaining 30% is contributed by new users. The replacement sales will rise to 80% in the future. This will result in high demand for semiconductor ICs and increased production capacities of foundries, indirectly triggering the need for mask inspection equipment.”

According to the report, growing requirement of semiconductor inspection systems will be a key driver for market growth. The technical development in the electronics and semiconductor device markets is propelling wafer manufacturers to invest heavily. E-beam inspection equipment involves a high quality of inspection with a resolution of 3 nm. At present, different manufacturing units prefer such equipment mainly for R&D purposes. This will have a moderately high impact on semiconductor foundries as such equipment works with a very high level of magnification. Furthermore, charge variation defects can only be inspected using e-beam equipment, which provides R&D engineers with detailed information on the minutest of defects.

Further, the report states that the capital expenditure of semiconductor device manufacturers affects semiconductor manufacturing equipment vendors. During the period of overcapacity, device manufacturers reduce their capital expenditure and demand for semiconductor manufacturing equipment. This results in underutilization of vendor factories. During this cyclical period, customers reduce purchases, delay delivery of ordered products, or cancel orders. This results in reduced net sales and backlog, delays in revenue recognition, and excess inventory for the vendors, which act as a major challenge for vendors.

The study was conducted using an objective combination of primary and secondary information including inputs from key participants in the industry. The report contains a comprehensive market and vendor landscape in addition to a SWOT analysis of the key vendors.
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- Applied Materials
- Hermes Microvision
- KLA-Tencor
- Lasertec
- ASML Holding
- Carl Zeiss
- FEI
- Hitachi High-Technologies
- JEOL
- Nanometrics
- Nikon
- Planar
- Lam Research
- Rudolph Technologies
- Tokyo Seimitsu
- Toray Engineering.
Note: Product cover images may vary from those shown
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Note: Product cover images may vary from those shown
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