2. Key mechanics concepts;
3. Fracture mechanics;
6. Channeling/tunneling cracks;
8. Penetration vs deflection vs arrest;
9. Edge and corner interface cracks;
10. Buckling delamination;
11. Thin strips (patterned lines);
12. Steady-state temperature gradients;
13. Cracking due to temperature transients;
14. Software for steady-state delamination;
15. Software for transient behavior;
16. FEA software for multilayers;
17. Convergence and benchmarks with LS-FEA.
Professor Matthew R. Begley is recognized for seminal contributions in the mechanics of multilayered systems, with an emphasis on computational aspects of the required analysis. His codes are employed in some industries to design experiments, assess current designs and evaluate novel multilayer systems for improved performance. He is widely sought after for consulting work on the mechanics of thin films, coatings and multilayers, by companies such as General Electric, Pratt and Whitney, Intel, Sunpower, Raytheon and Areva.
John W. Hutchinson Harvard University, Massachusetts.
Professor John W. Hutchinson is a member of the US National Academies of Engineering and Sciences and a Foreign Member of the Royal Society of London. He is one of the leading experts in the mechanics of thin film systems, with a number of highly cited, seminal journal papers on the subject. Hutchinson is credited with generating many of the conceptual developments in this field, as well as illustrations of those concepts to applications such as microelectronics, thermal barrier coatings, microfluidic devices and hypersonics.