Materials Characterization. Introduction to Microscopic and Spectroscopic Methods. 2nd Edition

  • ID: 2488820
  • Book
  • 392 Pages
  • John Wiley and Sons Ltd
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author′s experience in teaching advanced undergraduate and postgraduate university students.

The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions – in total about 20% new content.

The first part covers commonly used methods for microstructure analysis, including light microscopy, X–ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X–ray energy dispersive spectroscopy, fluorescence X–ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra–red and Raman) and the increasingly important thermal analysis.

The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy–to–read text, the book never loses sight of its intended audience.
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PREFACE

LIGHT MICROSCOPY

Optical Principles

Instrumentation

Specimen Preparation

Imaging Modes

Confocal Microscopy

X–RAY DIFFRACTION METHODS

X–Ray Radiation

Theoretical Background of Diffraction

X–Ray Diffractometry

Wide–Angle X–Ray Diffraction and Scattering

TRANSMISSION ELECTRON MICROSCOPY

Instrumentation

Specimen Preparation

Image Modes

Selected–Area Diffraction (SAD)

Images of Crystal Defects

SCANNING ELECTRON MICROSCOPY

Instrumentation

Contrast Formation

Operational Variables

Specimen Preparation

Electron Backscatter Diffraction

Environmental SEM

SCANNING PROBE MICROSCOPY

Instrumentation

Scanning Tunneling Microscopy

Atomic Force Microscopy

Image Artifacts

X–RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS

Features of Characteristic X–Rays

X–Ray Fluorescence Spectrometry

Energy Dispersive Spectroscopy in Electron Microscopes

Qualitative and Quantitative Analysis

ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS

Basic Principles

Instrumentation

Characteristics of Electron Spectra

Qualitative and Quantitative Analysis

SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS

Basic Principles

Instrumentation

Surface Structure Analysis

SIMS Imaging

SIMS Depth Profiling

VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS

Theoretical Background

Fourier Transform Infrared Spectroscopy

Raman Microscopy

Interpretation of Vibrational Spectra

THERMAL ANALYSIS

Common Characteristics

Differential Thermal Analysis and Differential Scanning Calorimetry

Thermogravimetry

INDEX

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Yang Leng
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