Advanced Laser Diode Reliability

Table of Contents

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols

Authors

Massimo Vanzi Proffessor, University Cagliari, Italy. Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices Laurent Bechou Universit� de Sherbrooke. Laurent B�chou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosyst�mes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems. Mitsuo Fukuda Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Japan. Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories. Giovanna Mura Assistant Professor, University Cagliari, Italy. Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.