Advances in Imaging and Electron Physics. Volume 210

Table of Contents

1. Introduction to the Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for Use in Electronic Transport Devices Clifford M. Krowne 2. Determination of Reciprocal Lattice from Direct Space in 3D and 2D Clifford M. Krowne 3. Tight-Binding Formulation of Electronic Band Structure of Hexagonal Materials Clifford M. Krowne 4. Evaluation of the Matrix Elements for the Tight-Binding Formulation of Hexagonal Materials Clifford M. Krowne 5. Solving the Secular Equation of the System for Eigenenergy Clifford M. Krowne 6. Properties of the Bare Shifted Eigenenergy Determined as a Function of k Vector Clifford M. Krowne 7. Hamiltonian of the Two Atom Sublattice System Clifford M. Krowne 8. 2-Spinor and 4-Spinor Wavefunctions and Hamiltonians Clifford M. Krowne 9. Examination of the Relativistic Dirac Equation and Its Implications Clifford M. Krowne 10. Different Onsite Energies for the Two Atom Problem Clifford M. Krowne 11. Overall Conclusion Clifford M. Krowne 12. Performing EELS at Higher Energy Losses at Both 80 and 200 kV Ian MacLaren, Rebecca B. Cummings, Fraser Gordon, Enrique Frutos-Myro, Sam McFadzean, Andy Brown, and Alan Craven

Authors

Peter W. Hawkes Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France. Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.