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High Performance Silicon Imaging. Edition No. 2. Woodhead Publishing Series in Electronic and Optical Materials

  • ID: 4753511
  • Book
  • 525 Pages
  • Elsevier Science and Technology
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High Performance Silicon Imaging: Fundamentals and Applications of CMOS and CCD Sensors, Second Edition, covers the fundamentals of silicon image sensors, addressing existing performance issues and current and emerging solutions. Silicon imaging is a fast growing area of the semiconductor industry. Its use in cell phone cameras is already well established, with emerging applications including web, security, automotive and digital cinema cameras. The book has been revised to reflect the latest state-of-the art developments in the field, including 3D imaging, advances in achieving lower signal noise, and new applications for consumer markets.

The fundamentals section has also been expanded to include a chapter on the characterization and testing of CMOS and CCD sensors that is crucial to the success of new applications. This book is an excellent resource for both academics and engineers working in the optics, photonics, semiconductor and electronics industries.

  • Covers the fundamentals of silicon-based image sensors and technical advances, focusing on performance issues
  • Looks at image sensors in applications, such as mobile phones, scientific imaging, and TV broadcasting, and in automotive, consumer and biomedical applications
  • Addresses the theory behind 3D imaging and 3D sensor development, including challenges and opportunities
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Part I Fundamentals 1. Fundamental principles of photosensing  2. Operational principles of silicon image sensors 3. Charge coupled device (CCD) image sensors 4. Backside illuminated (BSI) complementary metal-oxide-semiconductor (CMOS) image sensors 5. Circuits for high performance complementary metal-oxide-semiconductor (CMOS) image sensors 6. Smart cameras on a chip: using complementary metal-oxide-semiconductor (CMOS) image sensors to create smart vision chips 7. Characterization and test of CMOS and CCD image sensors

Part II Applications 8. Complementary metal-oxide-semiconductor (CMOS) image sensors for mobile devices 9. Complementary metal-oxide-semiconductor (CMOS) image sensors for automotive applications 10. Complementary metal-oxide-semiconductor (CMOS) image sensors for use in space 11. Complementary metal-oxide-semiconductor (CMOS) sensors for high-performance scientific imaging 12. Time-of-Flight based 3D imaging and ranging based on active illumination and CMOS sensors and applications in consumer and automotive markets 13. Complementary metal-oxide-semiconductor (CMOS) sensors for fluorescence lifetime imaging (FLIM) 14. Complementary metal-oxide-semiconductor (CMOS) X-ray sensors 15. Complementary metal-oxide-semiconductor (CMOS) and charge coupled device (CCD) image sensors in high-definition TV imaging 16. High-performance silicon imagers and their applications in astrophysics, medicine and other fields

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Durini, Daniel
Daniel Durini is currently Research Professor in areas of microelectronics and radiation detection at the National Institute of Astrophysics, Optics and Electronics (INAOE) in Puebla, Mexico. He obtained the B.Sc. degree in Electrical-Electronic Engineering from the National Autonomous University of Mexico (UNAM) in 2002, the M.Sc. degree in area of Microelectronics from the National Institute of Astrophysics, Optics and Electronics in Mexico in 2003, and the Ph.D. degree in area of Microelectronics from the University of Duisburg-Essen in Germany in 2009. He was with the Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) in Duisburg, Germany, between 2004 and end of 2013, where he led during the last four years a group dedicated to developing special CMOS process modules for high-performance photodetection devices, pixel structures and imagers. Prior to his current position, he was with the Central Institute of Engineering, Electronics and Analytics, ZEA-2 - Electronic Systems of the research centre Forschungszentrum Jülich in Jülich, Germany, where he headed between 2015 and beginning of 2018 the development of Detector Systems dedicated to scientific applications. He received the Duisburger Sparkasse Award for outstanding Ph.D. thesis in 2009 and two best paper awards. He has authored and co-authored more than 60 technical papers and three book chapters, and holds six patents in the area of CMOS image sensors. He is Member of the IEEE since 2009, and forms part of the National System for Researchers (SNI) in Mexico since 2014.
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