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Reliability of Semiconductor Lasers and Optoelectronic Devices. Woodhead Publishing Series in Electronic and Optical Materials

  • Book

  • March 2021
  • Elsevier Science and Technology
  • ID: 5029570

Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D.

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Table of Contents

1. Introduction to optoelectronic devices
Robert W. Herrick and Qiang Guo
2. Reliability engineering in optoelectronic devices and fiber optic transceivers
Robert W. Herrick
3. Case studies in fiber optic reliability
Robert W. Herrick
4. Materials science of defects in GaAs-based semiconductor lasers
Kunal Mukherjee
5. Grown-in defects and thermal instability affecting the reliability of lasers: III-Vs versus III nitrides
Osamu Ueda and Shigetaka Tomiya
6. Reliability of lasers on silicon substrates for silicon photonics
Justin C. Norman, Daehwan Jung, Alan Y. Liu, Jennifer Selvidge, Kunal Mukherjee, John E. Bowers and Robert W. Herrick
7. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs
C. De Santi, A. Caria, F. Piva, G. Meneghesso, E. Zanoni and M. Meneghini


Robert Herrick Sr. Staff Engineer, Intel Corporation, USA. Dr. Robert W. Herrick is one of the world's leading authorities in semiconductor laser reliability and failure analysis with over 25 years of experience in this field. After receiving his MSEE from the University of Illinois, United States, he worked as a designer and process developer on many of the earliest record-breaking integrated photonics devices in the late 1980s and early 1990s. He did his PhD research at the University of California, Santa Barbara, United States in the mid-1990s, doing the first research on VCSEL reliability and failure analysis. After graduating, he worked for many of the largest optoelectronic transceiver providers, including HP/Agilent, EMCORE, Finisar, and JDSU, primarily in VCSEL reliability and failure analysis, but also in roles in fiber optic transceiver reliability. He now works for Intel's Silicon Photonics Product Division and is the Principal Engineer responsible for laser reliability. Osamu Ueda Meiji University, Tokyo, Japan. Dr. and Prof. Osamu Ueda received BS and PhD degrees from the University of Tokyo, Japan, in 1974 and 1990, respectively. He joined Fujitsu Laboratories Ltd. in 1974. Since then, his research has been focused on the evaluation of defects and microstructures in various semiconducting materials and degradation mechanism of compound semiconductor optical devices such as semiconductor lasers and LEDs for over 30 years. The key technique of his work is transmission electron microscopy for the characterization of defects in semiconductors and degraded optical devices. He left Fujitsu Laboratories Ltd. in 2005 and joined the Kanazawa Institute of Technology, Tokyo, Japan as a professor until 2019. He is currently a visiting professor at the Meiji University, Tokyo, Japan. He authored more than 150 scientific papers including 30 invited papers, 5 books, and 56 patents.