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Quantitative Atomic-Resolution Electron Microscopy, Vol 217. Advances in Imaging and Electron Physics

  • ID: 5180546
  • Book
  • April 2021
  • 232 Pages
  • Elsevier Science and Technology
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
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1. Introduction Sandra Van Aert 2. Statistical parameter estimation theory Sandra Van Aert 3. Efficient fitting algorithm Sandra Van Aert 4. Statistics-based atom counting Sandra Van Aert 5. Atom column detection Sandra Van Aert 6. Optimal experiment design for nanoparticle atom-counting from ADF STEM images Sandra Van Aert 7. Maximum a posteriori probability Sandra Van Aert 8. Discussion and conclusions Sandra Van Aert 9. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia
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