Reliability and Failure Analysis of High-Power LED Packaging. Woodhead Publishing Series in Electronic and Optical Materials

Table of Contents

1. LED package materials
2. LED failure mechanisms
3. LED failure analysis techniques
4. Effect of environment on LED lifetime and package reliability assessment
5. Lumen recovery in high power LEDs under prolonged outdoor operation
6. LED permanent degradation mechanisms under prolonged outdoor applications
7. Effect of phosphors in LEDs and package degradation
8. Blue vs White LED package degradation in LEDs under different conditions
9. LED package degradation in outdoor applications and its evolution with time
10. Reliability tests for LEDs
11. Conclusion and Future Work

Authors

Cher Ming Tan Center for Reliability Sciences and Technologies, Chang Gung University, Taiwan; Center for Reliability Engineering, Ming Chi University of Technology, Taiwan. Professor Cher Ming Tan obtained his PhD in Electrical Engineering from the University of Toronto in 1992. He has eight years of working experience in reliability in the electronics industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as a faculty member in 1996 where he stayed until 2014. He is now a Professor at Chang Gung University, Taiwan, and the Director of the Centre of Reliability Science and Technology (CReST). He has published more than 400 international journal and conference papers and holds 14 patents and 1 copyright for reliability software. He has given more than 100 keynote and invited talks at international conferences. He has written 6 books and 4 book chapters in the field of reliability. He is the Series Editor of Springer Briefs in Reliability, Editor of Scientific Reports, Editor of IEEE Transactions on Materials and Device Reliability, Associate Editor of Microelectronics Reliability, and Research Editor of Frontiers in Materials. He is Fellow of the Institute of Engineers, Singapore, Fellow of the Singapore Quality Institute, and an IEEE Electron Devices Distinguished Lecturer. He is also on the technical committee for reviewing IEEE Reliability Standards 1413.1 and 1624. Preetpal Singh Center for Reliability Engineering, Ming Chi University of Technology, Taiwan. Dr. Preetpal Singh received his BS from the Guru Nanak Engineering College, Hyderabad, India, in 2007, and MS from Amity University, Noida, India, in 2013. He completed his PhD in 2018 with the Department of Electronic Engineering and Center for Reliability Sciences and Technologies (CReST), Chang Gung University in Taoyuan, Taiwan. His research interests include graphene-based high-power LEDs, high-power LED degradation study, and LED reliability. He has published his research in reputed journals like the IEEE-TDMR, Microelectronics Reliability, and Scientific Reports. He holds a US patent for his work on High Power LEDs substrate-GaN thermal and lattice mismatch improvement. He is also the Reviewer for the IEEE-TDMR and microelectronics journals. Presently he is working with Epistar, Taiwan, as Senior Research Engineer and is responsible for development of different types of LEDs.