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Advances in Imaging and Electron Physics

  • Book

  • August 2021
  • Elsevier Science and Technology
  • ID: 5275301

Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

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Table of Contents

Preface Martin H?tch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moir? sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moir? sampling geometrical phase analysis (STEM moir? GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moir? sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moir? sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade