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A Practical Guide to Total Reflection X-ray Fluorescence

  • Book

  • January 2024
  • Elsevier Science and Technology
  • ID: 5789774

A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful, accurate results. Sections describe the theoretical aspects of methods and applications, emphasizing a practical approach, including advantages and limitations. The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis, including aspects like samples, sample handling and quantification. Key case studies emphasizing the strength of the method are included. The book also explains the calibration of instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation.

This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.

Table of Contents

PART I: The Method1. Theoretical Background2. TXRF Instrumentation for different energy ranges and Experimental 3. ParametersAnalyzing Samples using TXRFSamples and sample preparation Sample presentation and instrumental parameters4. Validation and Performance of TXRF5. Performance of TXRF and Comparison to other Methods6. Related Methods to TXRF

PART II: APPLICATIONS7. Geological and Environmental Applications8. Clinical, Medical, and Biological Applications9. Food and Beverages10. Cultural Heritage11. Chemical, Pharmaceutical, and Petrochemical Applications12. Advanced Nanomaterials and Industrial Application13. Energy related materials, and Industrial Applications

Part III: CONCLUSIONSTXRF checklist

Part IV: INDEXES

Authors

Martina Schmeling Associate Professor, Department of Chemistry and Biochemistry, Loyola University Chicago, IL, USA. Martina Schmeling studied at the University of Muenster and received her diploma in 1992. She earned her doctorate at the Institute of Spectrochemistry and Applied Spectroscopy (ISAS) and University of Dortmund in 1997 under the tutelage of R. Klockenkaemper and D. Klockow. She conducted post-doctoral research at the University of Antwerp with R. van Grieken and additional post-doctoral studies at Princeton University with L. Russell. Since 1999, she's been on the faculty of Loyola University Chicago in the field of analytical chemistry and trace elemental analysis. Martina has been involved in the NASA Genesis mission, in various air pollution and biological analysis projects. Her main interests are the study of biological and environmental systems by TXRF. Diane Eichert Senior Scientist, Elettra - Sincrotrone Trieste, Basovizza TS, Italy. Diane Eichert studied physico-chemistry at Bordeaux University and received her DEA in 1998. She earned her doctorate in Materials Science at Ecole Polytechnique of Toulouse (2001). She conducted post-doctoral research at the European Radiation Synchrotron Facility, Grenoble and Marie Curie Excellence Grant as scientist at Bessy II, Berlin, both in X-ray spectro-microscopies. Since 2007, she's been a senior scientist at Elettra Sincrotrone Trieste in the field of X-ray Fluorescence Analysis, where she developed instrumentation and beamline, XRF data analysis skills and applications in many fields of research. Her main interests reside in combining various X-ray and Infrared based analysis on the same sample (mainly biology and nanomaterials) and establishing reliable chemical measurement process with X-ray Fluorescence techniques.