Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
Table of Contents
- Preface
- Numerical Methods for Computing Electrostatic and Magnetic Fields
- Methods of Computing Optical Properties and Combating Aberrations for Low-Intensity Beams
- Emittance and Brightness: Definitions and Measurements*
- High-Resolution Scanning Transmission Low-Energy Ion Microscopes and Microanalyzers
- High-Energy Ion Microprobes
