Results for tag: "Focused Ion Beam"

The Focused Ion Beam (FIB) market is a subset of the semiconductor industry. FIB technology is used to create nanoscale structures and patterns on semiconductor materials. It is used in the fabrication of integrated circuits, microelectromechanical systems (MEMS), and other nanoscale devices. FIB technology is also used for failure analysis, defect localization, and reverse engineering. FIB systems are typically composed of a vacuum chamber, an ion source, a beam column, and a sample stage. The ion source generates a beam of ions, which is then focused and directed onto the sample. The beam is scanned across the sample to create patterns and structures. FIB technology is used in a variety of industries, including semiconductor, automotive, aerospace, and medical. It is also used in research and development, as well as in the production of consumer electronics. Some companies in the FIB market include FEI Company, Hitachi High-Technologies Corporation, JEOL Ltd., and Tescan USA, Inc. Show Less Read more