Results for tag: "Spectroscopic Ellipsometry"

Spectroscopic Ellipsometry is a technique used in chemical engineering to measure the optical properties of a material. It is used to measure the thickness, refractive index, and optical constants of thin films and surfaces. The technique is based on the principle of ellipsometry, which is the measurement of the change in polarization of light reflected from a surface. The technique is used to measure the optical properties of a wide range of materials, including semiconductors, metals, polymers, and biological materials. Spectroscopic Ellipsometry is used in a variety of applications, including the characterization of thin films, the study of surface chemistry, and the development of new materials. It is also used in the development of new optical devices, such as optical sensors and optical fibers. Companies in the Spectroscopic Ellipsometry market include J.A. Woollam Co., Inc., Horiba Scientific, and Rudolph Technologies. Show Less Read more